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    1. Silicon wafer AOI equipment

      Product Introduction

      Bright-field and dark-field wafer surface inspection using high-resolution imaging  based on three modes: image algorithm, detection model and anomaly detection, and provides statistical analysis.

      2D Inspection accuracy
      um

      1

      UPH
      pcs/h

      60

      Escape
      ppm

      ≤50

      乐鱼网页版登录入口-乐鱼(中国)

      乐鱼网页版登录入口-乐鱼(中国)